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GOST 16273.1-2014

GOST 33729-2016 GOST 20996.3-2016 GOST 31921-2012 GOST 33730-2016 GOST 12342-2015 GOST 19738-2015 GOST 28595-2015 GOST 28058-2015 GOST 20996.11-2015 GOST 9816.5-2014 GOST 20996.12-2014 GOST 20996.7-2014 GOST P 56306-2014 GOST P 56308-2014 GOST 20996.1-2014 GOST 20996.2-2014 GOST 20996.0-2014 GOST 16273.1-2014 GOST 9816.0-2014 GOST 9816.4-2014 GOST P 56142-2014 STATE STANDARD P 54493-2011 GOST 13498-2010 STATE STANDARD P 54335-2011 GOST 13462-2010 STATE STANDARD P 54313-2011 GOST P 53372-2009 GOST P 53197-2008 GOST P 53196-2008 GOST P 52955-2008 GOST P 50429.9-92 GOST 6836-2002 GOST 6835-2002 GOST 18337-95 GOST 13637.9-93 GOST 13637.8-93 GOST 13637.7-93 GOST 13637.6-93 GOST 13637.5-93 GOST 13637.4-93 GOST 13637.3-93 GOST 13637.2-93 GOST 13637.1-93 GOST 13637.0-93 STATE STANDARD 13099-2006 GOST 13098-2006 GOST 10297-94 GOST 12562.1-82 GOST 12564.2-83 GOST 16321.2-70 GOST 4658-73 GOST 12227.1-76 GOST 16274.0-77 GOST 16274.1-77 GOST 22519.5-77 GOST 22720.4-77 GOST 22519.4-77 GOST 22720.2-77 GOST 22519.6-77 GOST 13462-79 GOST 23862.24-79 GOST 23862.35-79 GOST 23862.15-79 GOST 23862.29-79 GOST 24392-80 GOST 20997.5-81 GOST 24977.1-81 GOST 25278.8-82 GOST 20996.11-82 GOST 25278.5-82 GOST 1367.7-83 GOST 26239.9-84 GOST 26473.1-85 GOST 16273.1-85 GOST 26473.2-85 GOST 26473.6-85 GOST 25278.15-87 GOST 12223.1-76 GOST 12645.7-77 GOST 12645.1-77 GOST 12645.6-77 GOST 22720.3-77 GOST 12645.4-77 GOST 22519.7-77 GOST 22519.2-77 GOST 22519.0-77 GOST 12645.5-77 GOST 22517-77 GOST 12645.2-77 GOST 16274.9-77 GOST 16274.5-77 GOST 22720.0-77 GOST 22519.3-77 GOST 12560.1-78 GOST 12558.1-78 GOST 12561.2-78 GOST 12228.2-78 GOST 18385.4-79 GOST 23862.30-79 GOST 18385.3-79 GOST 23862.6-79 GOST 23862.0-79 GOST 23685-79 GOST 23862.31-79 GOST 23862.18-79 GOST 23862.7-79 GOST 23862.1-79 GOST 23862.20-79 GOST 23862.26-79 GOST 23862.23-79 GOST 23862.33-79 GOST 23862.10-79 GOST 23862.8-79 GOST 23862.2-79 GOST 23862.9-79 GOST 23862.12-79 GOST 23862.13-79 GOST 23862.14-79 GOST 12225-80 GOST 16099-80 GOST 16153-80 GOST 20997.2-81 GOST 20997.3-81 GOST 24977.2-81 GOST 24977.3-81 GOST 20996.4-82 GOST 14338.2-82 GOST 25278.10-82 GOST 20996.7-82 GOST 25278.4-82 GOST 12556.1-82 GOST 14339.1-82 GOST 25278.9-82 GOST 25278.1-82 GOST 20996.9-82 GOST 12554.1-83 GOST 1367.4-83 GOST 12555.1-83 GOST 1367.6-83 GOST 1367.3-83 GOST 1367.9-83 GOST 1367.10-83 GOST 12554.2-83 GOST 26239.4-84 GOST 9816.2-84 GOST 26473.9-85 GOST 26473.0-85 GOST 12645.11-86 GOST 12645.12-86 GOST 8775.3-87 GOST 27973.0-88 GOST 18904.8-89 GOST 18904.6-89 GOST 18385.0-89 GOST 14339.5-91 GOST 14339.3-91 GOST 29103-91 GOST 16321.1-70 GOST 16883.2-71 GOST 16882.1-71 GOST 12223.0-76 GOST 12552.2-77 GOST 12645.3-77 GOST 16274.2-77 GOST 16274.10-77 GOST 12552.1-77 GOST 22720.1-77 GOST 16274.4-77 GOST 16274.7-77 GOST 12228.1-78 GOST 12561.1-78 GOST 12558.2-78 GOST 12224.1-78 GOST 23862.22-79 GOST 23862.21-79 GOST 23687.2-79 GOST 23862.25-79 GOST 23862.19-79 GOST 23862.4-79 GOST 18385.1-79 GOST 23687.1-79 GOST 23862.34-79 GOST 23862.17-79 GOST 23862.27-79 GOST 17614-80 GOST 12340-81 GOST 31291-2005 GOST 20997.1-81 GOST 20997.4-81 GOST 20996.2-82 GOST 12551.2-82 GOST 12559.1-82 GOST 1089-82 GOST 12550.1-82 GOST 20996.5-82 GOST 20996.3-82 GOST 12550.2-82 GOST 20996.8-82 GOST 14338.4-82 GOST 25278.12-82 GOST 25278.11-82 GOST 12551.1-82 GOST 25278.3-82 GOST 20996.6-82 GOST 25278.6-82 GOST 14338.1-82 GOST 14339.4-82 GOST 20996.10-82 GOST 20996.1-82 GOST 12645.9-83 GOST 12563.2-83 GOST 19709.1-83 GOST 1367.11-83 GOST 1367.0-83 GOST 19709.2-83 GOST 12645.0-83 GOST 12555.2-83 GOST 1367.1-83 GOST 9816.3-84 GOST 9816.4-84 GOST 9816.1-84 GOST 9816.0-84 GOST 26468-85 GOST 26473.11-85 GOST 26473.12-85 GOST 26473.5-85 GOST 26473.7-85 GOST 16273.0-85 GOST 26473.3-85 GOST 26473.8-85 GOST 26473.13-85 GOST 25278.13-87 GOST 25278.14-87 GOST 8775.1-87 GOST 25278.17-87 GOST 18904.1-89 GOST 18904.0-89 STATE STANDARD P 51572-2000 GOST 14316-91 GOST P 51704-2001 GOST 16883.1-71 GOST 16882.2-71 GOST 16883.3-71 GOST 8774-75 GOST 12227.0-76 GOST 12797-77 GOST 16274.3-77 GOST 12553.1-77 GOST 12553.2-77 GOST 16274.6-77 GOST 22519.1-77 GOST 16274.8-77 GOST 12560.2-78 GOST 23862.11-79 GOST 23862.36-79 GOST 23862.3-79 GOST 23862.5-79 GOST 18385.2-79 GOST 23862.28-79 GOST 16100-79 GOST 23862.16-79 GOST 23862.32-79 GOST 20997.0-81 GOST 14339.2-82 GOST 12562.2-82 GOST 25278.7-82 GOST 20996.12-82 GOST 12645.8-82 GOST 20996.0-82 GOST 12556.2-82 GOST 25278.2-82 GOST 12564.1-83 GOST 1367.5-83 GOST 25948-83 GOST 1367.8-83 GOST 1367.2-83 GOST 12563.1-83 GOST 9816.5-84 GOST 26473.4-85 GOST 26473.10-85 GOST 12645.10-86 GOST 8775.2-87 GOST 25278.16-87 GOST 8775.0-87 GOST 8775.4-87 GOST 12645.13-87 GOST 27973.3-88 GOST 27973.1-88 GOST 27973.2-88 GOST 18385.6-89 GOST 18385.7-89 GOST 28058-89 GOST 18385.5-89 GOST 10928-90 GOST 14338.3-91 GOST 10298-79 GOST P 51784-2001 GOST 15527-2004 GOST 28595-90 GOST 28353.1-89 GOST 28353.0-89 GOST 28353.2-89 GOST 28353.3-89 STATE STANDARD P 52599-2006

GOST 16273.1−2014 Selenium technical. Method of spectral analysis


GOST 16273.1−2014


INTERSTATE STANDARD

SELENIUM TECHNICAL

Method of spectral analysis

Selenium technical. Method of spectral analysis


ISS 77.120.99

Date of introduction 2015−09−01


Preface

Goals, basic principles and main procedure of works on interstate standardization have been established in GOST 1.0−92 «interstate standardization system. Basic provisions» and GOST 1.2−2009 «interstate standardization system. Interstate standards, rules and recommendations on interstate standardization. Rules of development, adoption, application, renewal and cancellation»

Data on standard

1 DEVELOPED by the Technical Committee for standardization TC 368 «Copper"

2 recorded by the Interstate technical Committee for standardization MTK 503 «Copper"

3 ACCEPTED by the Interstate Council for standardization, Metrology and certification (Protocol dated 30 may 2014 No. 67-P)

The adoption voted:

     
Short name of the country on MK (ISO 3166) 004−97
Country code MK (ISO 3166) 004−97 Abbreviated name of the national authority for standardization
Armenia AM
The Ministry Of Economic Development Of The Republic Of Armenia
Belarus BY
Gosstandart Of The Republic Of Belarus
Kyrgyzstan KG
Kyrgyzstandard
Russia EN
Rosstandart
Tajikistan TJ
Tajikstandart
Uzbekistan UZ
Uzstandard

4 by Order of the Federal Agency for technical regulation and Metrology from November 26, 2014 # 1775-St inter-state standard GOST 16273.1−2014 introduced as the national standard of the Russian Federation from September 1, 2015.

5 REPLACE GOST 16273.1−85


Information about the changes to this standard is published in the annual reference index «National standards», and the text changes and amendments — in monthly information index «National standards». In case of revision (replacement) or cancellation of this standard a notification will be published in the monthly information index «National standards». Relevant information, notification and lyrics are also posted in the information system of General use — on the official website of the Federal Agency for technical regulation and Metrology on the Internet

1 Scope


This standard specifies the spectral emission measurement methods the mass fraction of copper, iron, lead, tellurium, arsenic, mercury, aluminum, sodium, antimony, calcium, magnesium, potassium, sulphur, cadmium, Nickel and selenium in the technical ranges of mass fraction, are presented in table 1.

     
Table 1
Percentage
Component Measurement range of mass fraction of component
  emission spectral method with the photoelectric registration of spectra with the use of the analyzer Maes
the spectral emission method with inductively coupled plasma
Copper
From of 0.0002 to 0.010 is incl. From 0,0002 0,0050 to incl.
Iron
0.001 to 0,010 incl. From of 0.0002 to 0.010 is incl.
Lead
From 0.0005 to 0.20 incl. From 0,0002 0,0050 to incl.
Tellurium
From 0.002 to 0.20 incl. From 0.0005 to 0.10 incl.
Arsenic
From 0.001 to 0.20 incl. From 0,0002 0,0050 to incl.
Mercury
From 0.0005 to 0,010 incl. From 0.0005 to 0,010 incl.
Aluminium
From 0.0005 to 0,010 incl. From 0,0002 0,0050 to incl.
Sodium
- From 0.0005 to 0,0050 incl.
Antimony
- From 0,0002 0,0050 to incl.
Calcium
- From 0,0002 0,0050 to incl.
Magnesium
- From 0,0002 0,0050 to incl.
Potassium
- From 0,0002 0,0050 to incl.
Sulfur
- From 0.0005 to 0.020 incl.
Cadmium
- From 0,0002 0,0050 to incl.
Nickel
- From 0,0002 0,0050 to incl.


General requirements to methods of measurement, safety requirements, verification of the accuracy of measurements in accordance with GOST 25086, GOST 16273.0.

2 Normative references


This standard uses the regulatory references to the following international standards:

GOST 1770−74 laboratory Glassware measuring glass. Cylinders, beakers, flasks, test tubes. General specifications

GOST 4233−77 Reagents. Sodium chloride. Specifications

GOST 6709−72 distilled Water. Specifications

GOST 9147−80 Glassware and equipment lab porcelain. Specifications

GOST 10157−79 Argon gaseous and liquid. Specifications

GOST 11125−84 nitric Acid of high purity. Specifications

GOST 14261−77 hydrochloric Acid of high purity. Specifications

GOST 16273.0−85 Selenium technical. General requirements for method of spectral analysis

GOST 18300−87 ethyl rectified technical. Specifications

GOST 23463−79 Graphite powder of high purity. Specifications

GOST 24104−2001* laboratory Scales. General technical requirements
________________
* On the territory of the Russian Federation GOST R 53228−2008 Scales non-automatic actions. Part 1. Metrological and technical requirements. Test.


GOST 25086−2011 non-ferrous metals and their alloys. General requirements for methods of analysis

GOST 25336−82 Glassware and equipment laboratory glass. The types, basic parameters and dimensions

GOST 29227−91 (ISO 835−1-81) oils. Pipettes are graduated. Part 1. General requirements

GOST ISO 5725−6-2002* Accuracy (trueness and precision) of methods and measurement results. Part 6. The use of precision values in practice
________________
* On the territory of the Russian Federation GOST R ISO 5725−6-2002 Accuracy (correctness and precision) of methods and measurement results. Part 6. The use of precision values in practice.


Note — When using this standard appropriate to test the effect of reference standards for the sign «National standards» drawn up as of January 1 of the current year and related information signs, published in the current year. If the reference standard is replaced (changed), when using this standard should be guided by replacing (amended) standard. If the reference standard is cancelled without replacement, then the situation in which the given link applies to the extent that does not affect this link.

3 emission Spectral method with photovoltaic spectra

3.1 Scope

In this section, the set of spectral emission method of measurement with photoelectric registration of spectrum of the mass fraction of copper, iron, lead, tellurium, arsenic, mercury and aluminum within the ranges presented in table 1.

3.2 characteristics of the indicators of measurement accuracy

The accuracy of the measurements the mass fraction of copper, iron, lead, mercury, tellurium, arsenic, aluminum, corresponds to the characteristics given in table 2 (with R=0,95).

Limit values of repeatability and reproducibility of measurements for a confidence probability P=0.95 is shown in table 2.


Table 2 — Values of the measure of the accuracy, limits of repeatability and reproducibility of measurements of mass fraction of copper, iron, lead, tellurium, arsenic, mercury, aluminum, at confidence probability P=0,95

Percentage

       
The designated component, measurement range

The accuracy rate, ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

Limits (absolute values)
    repeatability, r(n=2)
reproducibility, R
Copper
From of 0.0002 to 0.010 is incl.

0,4ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа*

0,3ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,5ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

Iron
0.001 to 0,010 incl.

0,4ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа*

0,3ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,5ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

Lead
From 0.0005 to 0.20 incl.
     
Tellurium
From 0.002 to 0.20 incl.
     
Arsenic
From 0.001 to 0.20 incl.
     
Mercury
From 0.0005 to 0,010 incl.
     
Aluminium
From 0.0005 to 0,010 incl.
     

* ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа — the measurement result

3.3 measurement Means, auxiliary devices, materials, solutions

When performing measurements using the following measuring instruments and auxiliary devices:

— diffraction spectrometer type IFS with the analyzer Maes;

— drying Cabinet, providing a heating temperature of from 100 °C to 105 °C;

— special laboratory scales of accuracy class according to GOST 24104;

— device for sharpening carbon electrodes, for example, the machine model CP-35, CCS-6;

box of organic glass;

— a mortar made of organic glass;

electrodes graphite high purity [1], grade not below the EU 12, with a diameter of 6 mm, a length of 35−55 mm, with a crater diameter of 4 mm, depth 4 mm and sharpened to a cone;
________________
* POS. [1]-[3], see Bibliography. — Note the manufacturer’s database.


— stainless steel tweezers;

— volumetric flasks 2−50−2 according GOST 1770;

— flasks KN-2−100−13/23ТХС according to GOST 25336;

pipettes 1−2-2−1, 1−2-2−2, 1−2-2−5, 1−2-2−10 according to GOST 29227.

When performing measurements, use the following materials, solutions:

— distilled water according to GOST 6709;

— ethyl alcohol according to GOST 18300;

sodium chloride according to GOST 4233;

— graphite powder of high purity according to GOST 23463;

— aluminum metal with a mass fraction of the basic substance of 99.9%;

iron metal with a mass fraction of the basic substance of 99.9%;

— copper oxide with a mass fraction of the basic substance of 99.9%;

— arsenic (III) oxide with a mass fraction of the basic substance of 99.9%;

— mercury oxide with a mass fraction of the basic substance of 99.9%;

lead oxide with a mass fraction of the basic substance of 99.9%;

the elementary selenium [2];

— tellurium metal, high purity [3].

Notes

1 allowed the use of other measuring instruments of the approved type, auxiliary devices and materials, technical and metrological characteristics are not inferior to mentioned above.

2 allowed the use of reagents produced by other normative documents, provided that their metrological characteristics of the measurement results given in the measurement technique.

3.4 Method of measurements

The method is based on measuring the intensity of spectral lines of the designated components during combustion of the sample from a crater of the carbon electrode.

3.5 preparing for the measurements

3.5.1 preparation of the device for measuring

The unit measurement is carried out in accordance with the requirements of the current operating instructions of the mass spectrometer. Set the operating parameters of the measurements in accordance with table 3.


Table 3 — Parameters measurements

   
The measurement parameters, units of measurement Options indices
  The IFS spectrometer with the analyzer Maes
Excitation source Arc DC power from 6 to 8, And
Electrodes The cathode graphite electrode filled breakdown Anode — graphite electrode, sharpened to a cone
The slit width of the spectrometer, mm 0,017
Intermediate diaphragm, mm 5
Exposure accumulation, MS 250
The exposure time, with 35
Note — these details are for guidance only and can be changed depending on the specifications of the spectrometer.


Analytical lines of the designated components, free from spectral overlaps are shown in table 4.

3.5.2 calibration of the spectrometer

The spectrometer will graduate when you create a method by means of comparison of the composition of selenium with each series of samples and build the dependence of the intensity of the analytical line from the mass fraction for each component you define.

In future work adjust calibration parameters in accordance with the manual of the spectrometer.

3.5.3 Graphite electrodes.

Electrodes with a crater and «cone» machined on the grinding machine in accordance with the operating manual.


Table 4 — Analytical lines components

   
The designated component
Wavelength, nm
Aluminium
308,215 266,039
Iron
302,064 259,940
Copper
327,396 223,015 282,437
Arsenic
234,984
Mercury
253,652
Lead
283,305 266,315 287,331
Tellurium
238,578 214,726
Note — allowed the use of other wavelengths, provided that the metrological characteristics presented in this method.

3.5.4 sample Preparation comparison. Samples for comparison are prepared in accordance with Annex A.

Value of mass fraction of aluminium, iron, copper, arsenic, mercury, lead and tellurium in samples of comparison composition of selenium SL-10ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаSL-1, are presented in table 5.


Table 5 — Parameters of the samples of comparison

Percentage

                     
The designated component The designation of the reference sample
  mass fraction
  SL 10*
SL 9* SL 8* SL 7* SL 6 SL 5 SL 4 SL 3 SL 2 SL 1
Aluminium

Iron

Copper

Arsenic

Mercury

Lead

Tellurium
0,2 0,1 0,05 0,02 0,01 0,005 0,002 0,001 0,0005 0,0002
*References used for measuring the mass fraction of arsenic, lead and tellurium.

3.6 performance measurement

3.6.1 General requirements for method of measurements in accordance with GOST 16273.0.

3.6.2 Mass fraction of impurities in the sample and the control sample to determine the parallel of the two batches, taking three individual measurements from each sample.

3.6.3 Sample is mixed with graphite in a ratio of 1:1, sodium chloride (10% of the total mass of the sample and graphite) to (0.3 g sample, 0.3 g graphite, and 0.6 g of sodium chloride) in a mortar made of organic glass.

Prepared samples and samples of comparison and into the craters of graphite electrodes by immersion.

Note — change of the mass of sample samples, graphite powder and sodium chloride, while maintaining the ratio of 1:1 samples and graphite and sodium chloride (10% of the total mass of the sample and graphite).

3.6.4 Simultaneously through all stages of sample preparation to the measurements carried out blank on the purity of reagents and materials.

Note — the Mass fraction of the designated component of experience the idle should not exceed the lower limit of the range of the designated contents.

3.7 processing of the results

3.7.1 Processing of results of measurements carried out using a software for a given program and present them in the form of a mass fraction of the designated component.

3.7.2 the measurement result taking the arithmetic mean of two parallel definitions, provided that the absolute difference between them in terms of repeatability does not exceed the value (at confidence probability P=0,95) repeatability limit rgiven in table 2.

If the discrepancy between the results of parallel measurements exceeds the limit value of the frequency of occurrence, perform the procedure described in GOST ISO 5725−6 (paragraph 5.2.2.1).

3.7.3 Differences between measurements obtained in two laboratories, should not exceed the values of the limit of reproducibility shown in table 2. In this case, the final result can be accepted their mean value. At default of this condition can be used the procedure set out in GOST ISO 5725−6.

4 Spectral emission method with inductively coupled plasma

4.1 Scope of applications

This section describes a spectral emission method with inductively coupled plasma measurements of the mass fraction of components in technical selenium in the ranges presented in table 1.

4.2 characteristics of the indicators of measurement accuracy

The accuracy of measuring the mass fraction of components in technical selenium corresponds to the characteristics given in table 6 (with R=0,95).

Limit values of repeatability and reproducibility of measurements for a confidence probability P=0.95 is given in table 6.


Table 6 — Values of the measure of the accuracy, limits of repeatability and reproducibility of measurements of mass fraction of components in technical Selene at confidence probability P=0,95

Percentage

         
The designated component Measurement range of mass fraction of component

The accuracy rate, ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

Limits (absolute values)
      repeatability, r (n=2)
reproducibility, R
Aluminium From 0,0002 0,0050 to incl.

0,4ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа*

0,3ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,6ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

Iron From of 0.0002 to 0.010 is incl.

0,4ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,3ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,6ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

Cadmium From 0,0002 0,0050 to incl.

0,5ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,3ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,6ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

Potassium From 0,0002 0,0050 to incl.

0,5ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,3ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,6ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

Calcium From 0,0002 0,0050 to incl.

0,5ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,3ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,6ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

Magnesium From 0,0002 0,0050 to incl.

0,5ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,3ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,6ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

Copper From 0,0002 0,0050 to incl.

0,5ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,3ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,7ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

Arsenic From 0,0002 0,0050 to incl.

0,4ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,3ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,6ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

Nickel From 0,0002 0,0050 to incl.

0,5ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,3ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,6ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

Lead From 0,0002 0,0050 to incl.

0,5ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,3ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,6ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

Antimony From 0,0002 0,0050 to incl.

0,5ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,3ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,6ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

Sodium From 0.0005 to 0,0050 incl.

0,4ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,4ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,6ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

Tellurium From 0.0005 to 0.10 incl.

0,4ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,3ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,6ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

Sulfur From 0.0005 to 0.020 incl.

0,5ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,3ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,6ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

Mercury SV. 0.0005 and 0.0015 incl.


From 0.0015 «0,010 «

0,5ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,4ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,3ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,3ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,6ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,6ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

* ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа — the measurement result

4.3 measurement Means, auxiliary devices, materials, solutions

When performing measurements using the following measuring instruments and auxiliary devices:

— the atomic emission spectrometer with inductively coupled plasma as the excitation source with all accessories;

— the stove is electric with a closed heating element for temperature up to 400 °C;

— special laboratory scales of accuracy class according to GOST 24104, with a readability of 0.0001 g;

— volumetric flasks 2−50−2, 2−100−2, 2−200−2 according GOST 1770;

— flasks KN-2−250−13/23ТХС according to GOST 25336;

-glasses-1−150 TS, -1−250-TS, N-1−150 TCS, N-1−250 TCS according to GOST 25336;

pipettes 1−2-2−1, 1−2-2−2, 1−2-2−5, 1−2-2−10 according to GOST 29227;

— beakers 50 according to GOST 1770;

— hour glass.

When performing measurements, use the following materials, solutions:

— distilled water according to GOST 6709;

— nitric acid of high purity according to GOST 11125;

acid salt of high purity according to GOST 14261 and diluted 1:5 and 1:19;

— argon gas according to GOST 10157;

— the state standard samples of composition of the solution ions: aluminum, iron, cadmium, potassium, calcium, magnesium, copper, arsenic, Nickel, lead, antimony, sodium, tellurium, sulfur, mercury, and the mass concentration of 1.0 mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа;

the elementary selenium [2].

Notes

1 allowed the use of other measuring instruments of the approved type, auxiliary devices and materials, technical and metrological characteristics are not inferior to mentioned above.

2 allowed the use of reagents produced by other normative documents, provided that their metrological characteristics of the measurement results given in the measurement technique.

4.4 Method of measurement

The method is based on measuring the intensity of spectral lines is determined by the components when excited atoms of the sample solution in inductively coupled plasma.

4.5 Preparation for measurement

4.5.1 preparation of the device for measurement

Preparing the spectrometer to the measurements carried out in accordance with the manual.

4.5.2 Preparation of solutions of known concentration

4.5.2.1 in preparing the solution of aluminum ions, iron, cadmium, calcium, magnesium with a mass concentration of 0.1 mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаin a volumetric flask with a capacity of 100 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаplaced at 10 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаof solutions of ions of aluminium, iron, cadmium, calcium, magnesium and the mass concentration of 1.0 mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа. Bring to mark with hydrochloric acid diluted 1:5 and stirred.

4.5.2.2 in preparing the solution of copper ions, arsenic, Nickel, lead, antimony with a mass concentration of 0.1 mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаin a volumetric flask with a capacity of 100 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаplaced at 10 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаof solutions of copper ions, arsenic, Nickel, lead, antimony with a mass concentration of 1.0 mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа. Bring to mark with hydrochloric acid diluted 1:5 and stirred.

4.5.2.3 in preparing the solution of aluminum ions, iron, cadmium, calcium, magnesium, copper, arsenic, Nickel, lead, antimony with a mass concentration of 0.01 mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаin a volumetric flask with a capacity of 100 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаplaced at 1.0 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаsolutions of aluminum ions, iron, cadmium, calcium, magnesium, copper, arsenic, Nickel, lead, antimony with a mass concentration of 1.0 mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа, made up to the mark with hydrochloric acid diluted 1:5 and stirred.

4.5.2.4 in the preparation of a solution of ions of tellurium, sodium and the mass concentration of 0.1 mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаin a volumetric flask with a capacity of 100 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаplaced at 10 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаof solutions of ions of tellurium, sodium and the mass concentration of 1.0 mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа, made up to the mark with hydrochloric acid diluted 1:5 and stirred.

4.5.2.5 in the preparation of a solution of ions of tellurium, sodium and the mass concentration of 0.01 mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаin a volumetric flask with a capacity of 100 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаis placed 10 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаof a solution containing 0.1 mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаions of tellurium, sodium, made up to the mark with hydrochloric acid diluted 1:5 and stirred.

4.5.2.6 in the preparation of a solution of sulfur ions with a mass concentration of 0.1 mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаin a volumetric flask with a capacity of 100 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаis placed 10 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаsolution of ions of sulfur mass concentration of 1.0 mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа, made up to the mark with hydrochloric acid diluted 1:5 and stirred.

4.5.2.7 in the preparation of a solution of sulfur ions with a mass concentration of 0.01 mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаin a volumetric flask with a capacity of 100 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаis placed 10 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаof a solution containing 0.1 mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаions of sulfur, made up to the mark with hydrochloric acid diluted 1:5 and stirred.

4.5.2.8 During the preparation of the solution of potassium ions with a mass concentration of 0.1 mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаin a volumetric flask with a capacity of 100 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаis placed 10 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаsolution of potassium ions containing 1.0 mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаpotassium ions, made up to the mark with hydrochloric acid diluted 1:5 and stirred.

4.5.2.9 in the preparation of a solution of potassium ions with a mass concentration of 0.01 mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаin a volumetric flask with a capacity of 100 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаis placed 1.0 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаof a solution containing 0.1 mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаpotassium ions, made up to the mark with hydrochloric acid diluted 1:5 and stirred.

4.5.2.10 in the preparation of a solution of mercury ions with a mass concentration of 0.1 mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаin a volumetric flask with a capacity of 100 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаis placed 10 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаsolution of mercury ions with a mass concentration of 1.0 mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа, made up to the mark with nitric acid, diluted 1:5 and stirred.

4.5.2.11 For preparation of a solution of selenium ions with the mass concentration of 100.0 mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаin a flask with a capacity of 250 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаis placed a portion of elemental selenium by weight of 20.00 g pour 50 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаof nitric acid, cover with watch glass and heated until complete decomposition of sample. Watch glass and walls of the flask is washed with water. The solution was cooled, transferred to a volumetric flask with a capacity of 200 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа, made up to the mark with water and mix.

4.5.3 Preparation of the calibration solutions

To prepare the calibration solutions in a volumetric flask with a capacity of 100 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаconsistently placed aliquots of solutions of known concentration according to the table 7 (for the determination of aluminium, iron, cadmium, calcium, magnesium, copper, arsenic, Nickel, lead, antimony, sodium, tellurium) and table 8 (for determining sulfur and potassium), made up to the mark with hydrochloric acid diluted 1:5, according to table 9 solutions for mercury determination top up to the mark with nitric acid, diluted 1:5 volumetric flasks with a capacity of 200 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаand mixed. Solutions are stable for 5 days.


Table 7

                               
The definition
given component
Marking and the mass concentration of the calibration solutions, the volume and mass concentration of solutions of known concentration
  1
2 3 4 5
  With V

WithГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

With V

WithГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

With V

WithГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

With V

WithГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

With V

With ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

Aluminium
0,01 0,5 0,05 0,01 1,0 0,1 0,01 3,0 0,3 0,1 1,0 1,0 0,1 2,0 2,0
Iron
0,01 0,5 0,05 0,01 1,0 0,1 0,01 3,0 0,3 0,1 1,0 1,0 0,1 2,0 2,0
Cadmium
0,01 0,5 0,05 0,01 1,0 0,1 0,01 3,0 0,3 0,1 1,0 1,0 0,1 2,0 2,0
Calcium
0,01 0,5 0,05 0,01 1,0 0,1 0,01 3,0 0,3 0,1 1,0 1,0 0,1 2,0 2,0
Magnesium
0,01 0,5 0,05 0,01 1,0 0,1 0,01 3,0 0,3 0,1 1,0 1,0 0,1 2,0 2,0
Copper
0,01 0,5 0,05 0,01 1,0 0,1 0,01 3,0 0,3 0,1 1,0 1,0 0,1 2,0 2,0
Arsenic
0,01 0,5 0,05 0,01 1,0 0,1 0,01 3,0 0,3 0,1 1,0 1,0 0,1 2,0 2,0
Nickel
0,01 0,5 0,05 0,01 1,0 0,1 0,01 3,0 0,3 0,1 1,0 1,0 0,1 2,0 2,0
Lead
0,01 0,5 0,05 0,01 1,0 0,1 0,01 3,0 0,3 0,1 1,0 1,0 0,1 2,0 2,0
Antimony
0,01 0,5 0,05 0,01 1,0 0,1 0,01 3,0 0,3 0,1 1,0 1,0 0,1 2,0 2,0
Sodium
0,01 0,5 0,05 0,01 1,0 0,1 0,01 3,0 0,3 0,1 1,0 1,0 0,1 2,0 2,0
Tellurium
0,01 0,5 0,05 0,01 1,0 0,1 0,01 3,0 0,3 0,1 1,0 1,0 0,1 2,0 2,0
Selenium

WITH A=100, V=40, FROMГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа=40000

Notes

1 With a mass concentration of a solution of known concentration, mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа; V — the volume of aliquote parts of a solution of known concentration, cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа; With theГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаmass concentration of the component determined µg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа.

2 these Data are for guidance only and can be changed depending on the sensitivity of emission spectrometry with inductively coupled plasma, uniformity of the analyte, etc.



Table 8

                               
The definition
given component
Marking and the mass concentration of the calibration solutions, the volume and mass concentration of solutions of known concentration
  1
2 3 4 5
  With V

WithГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

With V

With ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

With V

WithГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

With V

WithГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

With V

WithГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

Sulfur
0,01 2,0 0,2 0,01 4,0 0,4 0,01 6,0 0,6 0,1 1,0 1,0 0,1 2,0 2,0
Potassium
0,01 0,5 0,05 0,01 1,0 0,1 0,01 3,0 0,3 0,1 1,0 1,0 0,1 2,0 2,0
Selenium

WITH A=100, V=40, FROMГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа=40000

Notes

1 With a mass concentration of a solution of known concentration, mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа; V — the volume of aliquote parts of a solution of known concentration, cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа; With theГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаmass concentration of the component determined µg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа.

2 these Data are for guidance only and can be changed depending on the sensitivity of emission spectrometry with inductively coupled plasma, uniformity of the analyte, etc.



Table 9

                               
The definition
given component
Marking and the mass concentration of the calibration solutions, the volume and mass concentration of solutions of known concentration
  1
2 3 4 5
  With V

WithГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

With V

WithГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

With V

WithГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

With V

WithГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

With V

WithГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

Mercury
0,1 0,6 0,3 1,0 0,3 1,5 1,0 0,6 3,0 1,0 1,2 6,0 1,0 1,8 9,0
Selenium

WITH A=100, V=120, FROMГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа=60000

Notes

1 With a mass concentration of a solution of known concentration, mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа; V — the volume of aliquote parts of a solution of known concentration, cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа; With theГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаmass concentration of the component determined µg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа.

2 these Data are for guidance only and can be changed depending on the sensitivity of emission spectrometry with inductively coupled plasma, uniformity of the analyte, etc.


4.5.4 the Relationship of radiation intensity and the mass concentration of component in solution set two ways:

— with the help of calibration curve (method 1);

— using the addition method (method 2).

To measure mass proportions of the components according to the method 2 use solutions prepared according to 4.5.2.1−4.5.2.8.

4.5.5 In accordance with the manual of the spectrometer, launch a work program and perform at least two measurements of the analytical signal of the zero solution, then the corresponding calibration solution.

Expect calibration characteristics.

Note — the determination of the calibration parameters, processing and storage of the results of the calibration performed using standard software supplied with the spectrometer.


Stability control calibration parameters is carried out using a solution of N 2 comparisons. Calibration characteristics recognize stable if the deviation of the result from the set of content component in the solution of the comparison does not exceed 10% (Rel.)

The settings of the measurements are shown in table 10.


Table 10 — Parameters of measurement mode

   
The parameters of the measurement mode, units of measurement The value
The plasma power, kW
1,4

The flow rate of the cooling flow, DMГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа/min

12,00

The consumption of auxiliary flow, DMГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа/min

Of 1.00

The flow rate of the spray flow, DMГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа/min

Of 1.00
Speed peristaltic pump, rpm
30
The integration time of the signal,
From 3 to 20
Notes

1 Measurement of the analytical signal on the peak dynamic background correction.

2 these Data are for guidance only and can be changed depending on the sensitivity of emission spectrometry with inductively coupled plasma, etc.

4.5.6 Measuring the intensity of analytical spectral lines of defined components is carried out at wavelengths specified in table 11, to achieve the optimal values for sensitivity and precision components.


Table 11 — wavelengths

   
The designated component
Wavelength, nm
Arsenic 189,042;
Of 193.6
Iron 238,204
259,941
Aluminium 167,800
396,152
Sodium 589,592
Tellurium 170,000;
214,281 238,578
Sulfur 180,731
182,034
Cadmium 214,438
226,502
Mercury 253,652
Copper 324,754;
327,396
Lead 220,353; 168,220
Antimony 217,581; 231,147
Calcium 317,933
Magnesium 280,270
Potassium 766,491
Nickel 231,604
- -
Note — allowed the use of other wavelengths, provided that the required metrological characteristics

4.6 performance measurement

4.6.1 Simultaneously through all stages of sample preparation to the measurement carried out control and experience on the purity of the reagents.

4.6.2 Measurement of mass fractions of impurities in calibration schedule (method 1).

4.6.2.1 Mass fraction of impurities is determined in parallel in two batches.

4.6.2.2 Preparation of samples and measurement of the mass fraction of mercury is carried out apart from determining other components.

4.6.2.3 Sample sample weight from 1,9990 to 2,0010 g is placed in a conical flask with a capacity of 100 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа, flow 15 to 20 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаof a mixture of hydrochloric and nitric acids (3:1), covered with a lid and dissolve by heating for 20 min. Then cover and wall of the flask is washed with hydrochloric acid, diluted 1:19. The solution was cooled, transferred to a volumetric flask with a capacity of 50 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа, made up to the mark with water and mix.

4.6.2.4 For measuring the mass fraction of mercury in two samples sample weight (6,0000±0,0010) g are placed in two glasses with a capacity from 150 to 250 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа, moistened with water and poured 20 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаof nitric acid, cover with watch glass and heated until complete dissolution, add 5 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаof hydrochloric acid, then evaporated the beaker contents from 5 to 10 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа. After cooling, the solutions were transferred to volumetric flasks with a capacity of 100 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа, made up to the mark with nitric acid, diluted 1:5 and stirred.

4.6.2.5 the measurements are carried out in accordance with the manual of the spectrometer.

If the concentration of the component in the sample solution exceeds the concentration in the calibration solutions (the amount of signal above the last point of curve) carried out the dilution of the analyzed solution.

4.6.3 Measurement of the mass fraction of impurities using the addition method (method 2)

4.6.3.1 Mass fraction of the impurities measured in parallel in two batches.

4.6.3.2 the Mass fraction of potassium and sulfur are measured separately from the definition of other components.

4.6.3.3 Sample sample weight from 1,9990 to 2,0010 grams are placed in eight volumetric flasks with a capacity of 50 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаeach and dissolved in accordance with 4.6.2.2.

In six of the eight volumetric flasks with solutions samples introduced additives according to table 12. The solutions in all flasks is poured to the mark with water and mix.


Table 12

Percentage

       
The designated component The mass fraction of the designated component in the injected additives
  Supplement 1 Supplement 2
Supplement 3
 

WithГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

WithГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

WithГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

Arsenic
0,00025 0,00075 0,0020
Iron
     
Aluminium
     
Sodium
     
Tellurium
     
Copper
     
Lead
     
Antimony
     
Calcium
     
Magnesium
     
Cadmium
     
Nickel
     
Sulfur
     
Potassium
     

4.6.3.4 performance measurement is carried out in accordance with the manual of the spectrometer sequentially performs measurement of samples, the sample with addition of 1, samples with the addition of 2, samples with the addition of 3 (in ascending order of magnitude of supplements).

In accordance with the software of the spectrometer to build a chart — value of analytical signals of analysed sample solution and sample solution with the additive is applied to the y-axis, and the abscissa shows the delay values of the concentrations of the additives. Thus obtained direct extrapolat on the x-axis. The point of intersection on the x-axis indicates the mass concentration of the component in the analyzed sample solution.

4.6.4 Measurement should start after 20−30 minutes after ignition of the plasma to stabilize the measurement conditions.

4.7 processing of the results of measurements

4.7.1 measurement results of the mass concentration of a specific component in the sample is automatically displayed on the monitor screen.

4.7.2 Mass fraction of the designated component, X, %, is calculated by the formula

ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа, (1)


where And — mass concentration of the component in the sample obtained on the schedule or by way of supplements, µg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа;

V — solution volume, cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа;

m — weight of sample, g.

4.7.3 For the measurement result taking the arithmetic mean of two parallel definitions, provided that the absolute difference between them in terms of repeatability does not exceed the value (at confidence probability P=0,95) repeatability limit r given in table 6.

If the discrepancy between the results of parallel measurements exceeds the limit value of the frequency of occurrence, perform the procedure described in GOST ISO 5725−6 (paragraph 5.2.2.1).

4.7.4 Differences between measurements obtained in two laboratories, should not exceed the limit values for the reproducibility given in table 6. In this case, the final result can be accepted their mean value. At default of this condition can be used the procedure set out in GOST ISO 5725−6.

Annex a (recommended). Sample preparation comparison of the composition of Selena

Appendix A
(recommended)

A. 1 For preparation of the main solution And the composition of aluminum with a mass concentration of 10 mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаthe weight of aluminium metal weight of 0,500 g was placed in a conical flask with a capacity of 100 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа, poured when heated 30 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаof hydrochloric acid, then hydrochloric acid is added by portions until complete dissolution, the solution was cooled, transferred to a volumetric flask with a capacity of 50 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа, made up to the mark with water and mix.

A. 2 For the preparation of the basic solution B of the composition of iron with a mass concentration of 10 mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаa sample of iron metal with a mass of 0.5 g was placed in a conical flask with a capacity of 100 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа, poured when heated 15 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаof nitric acid, diluted 1:1, can withstand up to complete dissolution. The solution is evaporated to wet salts, add 10 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаof hydrochloric acid and heated until complete dissolution, cooled, transferred to a volumetric flask with a capacity of 50 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа, made up to the mark with water and mix.

A. 3 For the preparation of the basic mixture composition of graphite powder G-1 And with a mass fraction of aluminum, iron, copper, arsenic, mercury, lead and tellurium of 1% in a mortar put the hitch components and aliquote parts of solutions «A» and «B» according to table A. 1. The sample is stirred with the use of ethyl alcohol at the rate of 1.0 to 1.5 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаper 1 g of the mixture before drying and kept in a desiccator for 1 h at a temperature of from 100 °C to 105 °C.

A. 4 a Series of mixtures of the composition of graphite Gr-10ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаGr-1 is prepared by the method of successive dilution of the primary mixture of Gr-1 graphite powder. Sample of the mixture is adopted for the main and graphite powder, according to table A. 2, placed in a mortar and stirred with the use of ethyl alcohol at the rate of 1 to 1.5 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаper 1 g of the mixture before drying and kept in a desiccator for 1 h at a temperature of from 100 °C to 105 °C. the Values of mass fraction of aluminium, iron, copper, arsenic, mercury, lead and tellurium in certified mixtures of the composition of graphite powder is presented in table A. 1.

A. 5 a Series of mixtures of selenium composition SL-10ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаSL-1 is prepared by mixing each mixture composition of graphite Gr-10ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаGr-1 with selenium in a 1:1 ratio with addition of 10% sodium chloride in a mortar with the use of ethyl alcohol at the rate of 1 to 1.5 cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаper 1 g of the mixture before drying and kept in a desiccator for 1 h at a temperature of from 100 °C to 105 °C. the composition of Mixtures of selenium assigns values of mass fractions of impurities of the corresponding mixtures of graphite composition, each of the compounds was made. The mixture composition of selenium are used as comparison samples in constructing the calibration graph. Value of mass fraction of aluminium, iron, copper, arsenic, mercury, lead and tellurium in samples of comparison composition of selenium SL-1ГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаSL-10, is presented in table A. 3.


Table A. 1

             
The components of the mixture Chemical formula The weight of the portion m, g

Mass concentration, mg/cmГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

The volume of the aliquot of the basic solution, seeГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

Component Certified-
the value of A, %
Stock solution And the composition of aluminium
- - 10,0 10,0 Aluminium 1,0
Stock solution B of the composition iron
- - 10,0 10,0 Iron 1,0
Copper oxide
SPI 0,125 - - Copper 1,0
Arsenic oxide

ASГОСТ 16273.1-2014 Селен технический. Метод спектрального анализаOГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа

0,132 - - Arsenic 1,0
Mercury oxide HgO
0,108 - - Mercury 1,0
Lead oxide РbО
0,108 - - Lead 1,0
Tellurium technical
Those 0,100 - - Tellurium 1,0
Graphite powder
With 9,227 - - - -



Table A. 2

           
Designation of the mixture composition of graphite The characteristics of the mixture Marking the basic mixture composition of graphite

The weight of the portion main of the mixture mГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа, g

Its weight graphite mГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа, g

The mass fraction was about opredelennog component in the mixture composition of graphite AndГОСТ 16273.1-2014 Селен технический. Метод спектрального анализа, %

G-10
Mass fraction of aluminium G-1-A 4,000 16,000 0,2
  Mass fraction of iron       0,2
  Mass fraction of copper       0,2
  Mass fraction of arsenic       0,2
  Mass fraction of mercury       0,2
  Plumbum       0,2
  Mass fraction of tellurium       0,2
Gr-9
Mass fraction of aluminium G-10 9,500 9,500 0,1
  Mass fraction of iron       0,1
  Mass fraction of copper       0,1
  Mass fraction of arsenic       0,1
  Mass fraction of mercury       0,1
  Plumbum       0,1
  Mass fraction of tellurium       0,1
G-8
Mass fraction of aluminium Gr-9 9,000 9,000 0,05
  Mass fraction of iron       0,05
  Mass fraction of copper       0,05
  Mass fraction of arsenic       0,05
  Mass fraction of mercury       0,05
  Plumbum       0,05
  Mass fraction of tellurium       0,05
G-7
Mass fraction of aluminium G-8 8,000 12,000 0,02
  Mass fraction of iron       0,02
  Mass fraction of copper       0,02
  Mass fraction of arsenic       0,02
  Mass fraction of mercury       0,02
  Plumbum       0,02
  Mass fraction of tellurium       0,02
G-6
Mass fraction of aluminium G-7 9,500 9,500 0,01
  Mass fraction of iron       0,01
  Mass fraction of copper       0,01
  Mass fraction of arsenic       0,01
  Mass fraction of mercury       0,01
  Plumbum       0,01
  Mass fraction of tellurium       0,01
G-5
Mass fraction of aluminium G-6 9,000 9,000 0,005
  Mass fraction of iron       0,005
  Mass fraction of copper       0,005
  Mass fraction of arsenic       0,005
  Mass fraction of mercury       0,005
  Plumbum       0,005
  Mass fraction of tellurium       0,005
G-4
Mass fraction of aluminium
G-5 8,000 12,000 0,002
  Mass fraction of iron       0,002
  Mass fraction of copper       0,002
  Mass fraction of arsenic       0,002
  Mass fraction of mercury       0,002
  Plumbum       0,002
  Mass fraction of tellurium       0,002
Gr-3
Mass fraction of aluminium
G-4 8,500 8,500 0,001
  Mass fraction of iron       0,001
  Mass fraction of copper       0,001
  Mass fraction of arsenic       0,001
  Mass fraction of mercury       0,001
  Plumbum       0,001
  Mass fraction of tellurium       0,001
Gr-2
Mass fraction of aluminium
Gr-3 7,000 7,000 0,0005
  Mass fraction of iron       0,0005
  Mass fraction of copper       0,0005
  Mass fraction of arsenic       0,0005
  Mass fraction of mercury       0,0005
  Plumbum       0,0005
  Mass fraction of tellurium       0,0005
G-1
Mass fraction of aluminium
Gr-2 4,000 6,000 0,0002
  Mass fraction of iron       0,0002
  Mass fraction of copper       0,0002
  Mass fraction of arsenic       0,0002
  Mass fraction of mercury       0,0002
  Plumbum       0,0002
  Mass fraction of tellurium       0,0002



Table A. 3

                     
The designated component The designation of the reference sample
  mass fraction, %
  SL-10
SL-9 SL-8 SL-7 SL-6 SL-5 SL-4 SL-3 SL-2 SL-1
Aluminium

Iron

Copper

Arsenic

Mercury

Lead

Tellurium
0,2 0,1 0,05 0,02 0,01 0,005 0,002 0,001 0,0005 0,0002


Shelf life of samples comparison of the composition of selenium in one year.

Bibliography

     
[1] Specifications
THAT 3497−001−51046676−01*
Graphite electrodes, high purity
________________
* The one referred to here and hereinafter, not shown. For additional information, please refer to the link. — Note the manufacturer’s database.
[2] Specifications
THAT 6−09−2521−77
Selenium basic brand high purity 22−4, 17−4 high purity, high purity 17−3
[3] Specifications
THAT 48−0515−028−89
Tellurium metal purity brand extra



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669.776 UDC:543.42:006.354 ISS 77.120.99

Key words: selenium technical, the spectral emission method of measurement with photoelectric registration of spectrum, spectral emission method with inductively coupled plasma, measurements, indicators of accuracy of measurements, means of measurement, processing of measurement results