GOST 26239.0-84
GOST 26239.0−84 semiconductor Silicon, the starting materials for its production and quartz. General requirements for methods of analysis
GOST 26239.0−84
Group B59
STATE STANDARD OF THE USSR
SEMICONDUCTOR SILICON, THE STARTING MATERIALS FOR ITS PRODUCTION AND QUARTZ
General requirements for methods of analysis
Semiconductor silicon, raw materials for its production and quartz. General requirements for methods of analysis
AXTU 1709
Valid from 01.01.86
to 01.01.91*
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* Expiration removed
Protocol N 7−95 Interstate Council
for standardization, Metrology and certification
(IUS N 11, 1995). — Note the manufacturer’s database.
DEVELOPED by the Ministry of nonferrous metallurgy of the USSR
PERFORMERS
Y. A. Karpov, M. N. Schulepnikov, M. K. Vinnikov, G. G., Gavin, N. Gradskova, O. V. Zavialov, T. I. Zyablova, V. E., Quinn, V. A. Krylov, A. I. Kuzovlev, N. And. Marunya, V. G., Miscreants, V. M. Mikhailov, M. G. Nazarova, V. A. Orlov, A. I. Stepanov, N. With. Sysoeva, V. I. Firsov, G. I. Alexandrova
INTRODUCED by the Ministry of nonferrous metallurgy of the USSR
Member Of The Board Of A. P. Snurnikov
APPROVED AND put INTO EFFECT by Decision of the USSR State Committee on standards dated July 13, 1984 N 2490
1. This standard establishes General requirements for methods of analysis of semiconductor silicon, the starting materials to obtain (technical silicon, silicon tetrachloride, CHLOROSILANES, silicon dioxide) and quartz.
2. General requirements for methods of analysis GOST 26239.0−84 (ST SEV 314−76).
3. The selection and preparation of samples for analysis is carried out according to normative-technical documentation.
4. Of the sample and materials used for sample preparation and comparison of standard solutions weighed with an accuracy of 0.0002 g. more
5. For the taking of test portions used analytical laboratory scales type of VLA-200-M or VLR-20G, technical scales VPT-1, torsion scales W 500 GOST 13718−68 or similar types.
6. For heating solutions used electric cooker with a sealed coil according to GOST 14919−83.
7. For the preparation of solutions and tests used distilled water according to GOST 6709−72 and reagents qualification not lower than h. d. a., if you do not specify another.
8. For analysis use dimensional Petri dish below the second accuracy class according to GOST 20292−74* (burettes, pipettes) and GOST 1770−74 (cylinders, beakers, flasks), as well as glassware (beakers, conical flasks, etc.) according to GOST 25336−82, porcelain crucibles according to GOST 9147−80, quartz crucibles according to GOST 19908−80**, separating funnels, glass, conical GOST 25336−82, boxy glass according to GOST 25336−82, desiccators according to GOST 25336−82, dishes made of glassy carbon brand SU-2000.
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* On the territory of the Russian Federation there are 29169−91 GOST, GOST 29227−91−29229−91 GOST, GOST 29251−91-GOST 29253−91;
** On the territory of the Russian Federation GOST 19908−90. — Note the manufacturer’s database.
9. Allowed the use of other equipment, materials, utensils and reagents, subject to obtaining the metrological characteristics are not worse than specified in relevant standard methods of analysis.
10. In standard methods of analysis shows the allowable discrepancies under confidence probability of 0.95 or
of 0.90 for multiple values of mass fraction. Allowable differences for intermediate values calculated by linear interpolation.
11. Validation of the results of the analysis of semiconductor grade silicon, or raw products to get it carried out at least once per month and at least 
is the number of samples analysed per month, using the same apparatus, reagents and materials.
12. The correctness of analysis results control the manner specified in respective state standards on methods of analysis.
13. Security requirements for conducting tests of semiconductor silicon and source products obtain it — according to normative-technical documentation. The order and types of training workers in occupational safety is carried out in accordance with GOST 12.0.004−79*.
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* On the territory of the Russian Federation GOST 12.0.004−90. — Note the manufacturer’s database.
